Nguyen Thanh, Binh, The University of Danang, University of Science and Technology, Viet Nam

• Vol 5, No 5: October 2015 - Computer Science and Information Technology
  Survey on Mutation-based Test Data Generation
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).