Survey on Mutation-based Test Data Generation

Hanh Le Thi My, Binh Nguyen Thanh, Tung Khuat Thanh

Abstract


The critical activity of testing is the systematic selection of suitable test cases, which be able to reveal highly the faults. Therefore, mutation coverage is an effective criterion for generating test data. Since the test data generation process is very labor intensive, time-consuming and error-prone when done manually, the automation of this process is highly aspired. The researches about automatic test data generation contributed a set of tools, approaches, development and empirical results. In this paper, we will analyse and conduct a comprehensive survey on generating test data based on mutation. The paper also analyses the trends in this field.

Keywords


Constraint based testing; Dynamic symbolic execution; Mutation testing; Search-based test data generation; Test data generation

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DOI: http://doi.org/10.11591/ijece.v5i5.pp1164-1173

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).