Mufeed, Abdullah, Tishk International University, Iraq

• Vol 13, No 5: October 2023 - Circuits and Electronics
  Arduino based 74-series integrated circuits testing system at gate level
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).