Yusof, Yusmeeraz, Universiti Teknologi Malaysia, Johor Bahru, Malaysia, Malaysia

• Vol 7, No 3: June 2017 - Special_Invitation
  The Ab-initio Study of Bulk Single Layer Defected Graphene Towards Graphene Device
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).