Sontakke, Vijay, Intel Corporation, United States
-
Vol 13, No 6: December 2023 - Circuits and Electronics
A survey of scan-capture power reduction techniques
Abstract PDF -
Vol 14, No 1: February 2024 - Circuits and Electronics
Memory built-in self-repair and correction for improving yield: a review
Abstract PDF -
Vol 14, No 2: April 2024 - Circuits and Electronics
Testing nanometer memories: a review of architectures, applications, and challenges
Abstract PDF
This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.
International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578
This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).