Rao, V. Malleshwara, GITAM University, India

• Vol 8, No 4: August 2018 - Circuits and Electronics
  An approach to Measure Transition Density of Binary Sequences for X-filling based Test Pattern Generator in Scan based Design
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).