Patil, Sanjay B., Chattrapati Shivajiraje College of Engineering, India

• Vol 9, No 5: October 2019 - Signal_Image_Video_Processing_II
  Soybean leaf disease detection and severity measurement using multiclass SVM and KNN classifier
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES).