Sathyanarayana, Rekha, Don Bosco Institute of Technology, India

• Vol 14, No 1: February 2024 - Telecommunication System and Technology
  An efficient unused integrated circuits detection algorithm for parallel scan architecture
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).