Shakib, Muhammad Nazmus, Universiti Malaysia Pahang, Malaysia

• Vol 11, No 1: February 2021 - Electronics_Engineering_II
  Electrical characterization of si nanowire GAA-TFET based on dimensions downscaling
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).