A unique YOLO-based gated attention deep convolution network-Lichtenberg optimization algorithm model for a precise breast cancer segmentation and classification

Vinoth Rathinam, Sasireka Rajendran, Valarmathi Krishnasamy

Abstract


A novel you only look once (YOLO)-based gated attention deep convolution network (GADCN) classification algorithm is developed and utilized in this present study for the detection of breast cancer. In this framework, contrast enhancement-based histogram equalization is applied initially to produce the normalized breast image with reduced noise artifacts. Then, the breast region is accurately segmented from the preprocessed images with low complexity and segmentation error using the YOLO-based attention network model. To diagnose breast cancer with better accuracy, the GADCN model is used to predict the exact class of image (i.e., benign or malignant). During classification, the activation function is optimally computed with the use of the Lichtenberg optimization algorithm (LOA). It aids in achieving improved classification performance with little complexity in training and assessment. The significance of the present study includes the use of a unique, YOLO-based GADCN-LOA model that helps in the prediction of breast cancer with higher accuracy. It was observed that the model exhibited 99% accuracy for the datasets utilized. In addition, the selected model outperforms well with sensitivity, specificity, precision, and F1-score. Hence the proposed model could be exploited for the diagnosis of breast cancer at an early stage to enable preventive care.

Keywords


Breast cancer detection; Contrast limited adaptive histogram equalization; Deep learning, and computed aided diagnosis; Gated attention deep convolution network classification; Lichtenberg optimization algorithm; YOLO-based attention network segmentation

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DOI: http://doi.org/10.11591/ijece.v15i2.pp1670-1685

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).