EvalBERT: a novel framework for assisted descriptive answers and C programming evaluation
Abstract
Manual assessment of descriptive answers is often time-consuming, error-prone, and subject to bias. While artificial intelligence (AI) has made significant strides, current automated evaluation methods typically rely on simplistic metrics like word counts or predefined terms, which lack a deeper understanding of the content and are highly dependent on curated datasets. As demand for automated grading systems increases, there is a growing need to evaluate not only descriptive answers but also code-based responses. This study addresses these challenges by applying natural language processing (NLP) and deep learning (DL) techniques, testing three baseline models: multinomial Naïve bayes (MNB), bidirectional long short-term memory (Bi-LSTM), and bidirectional encoder representations from transformers (BERT). We propose EvalBERT, a BERT-based model fine-tuned with domain-specific academic corpora using computer processing unit (CPU) acceleration. EvalBERT automates grading for both descriptive and C programming exams, offering features like readability statistics and error detection. Experimental results show that EvalBERT achieves 94.86% accuracy, outperforming other models by 1.22 percentage points, with training time reduced by half. Additionally, EvalBERT is the first model pre-trained with academic corpora for this purpose. An interactive user interface, E-Pariksha, was also developed for administering and taking exams online. EvalBERT provides precise assessments, enabling educators to better evaluate student performance and offer more detailed feedback.
Keywords
Bidirectional encoder representations from transformers; Bi-directional long short-term memory; Graphical processing unit; Multinomial Naïve bayes; Natural language programming
Full Text:
PDFDOI: http://doi.org/10.11591/ijece.v15i3.pp3346-3361
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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578
This journal is published by the Institute of Advanced Engineering and Science (IAES).