Adversarial sketch-photo transformation for enhanced face recognition accuracy: a systematic analysis and evaluation

Raghavendra Mandara Shetty Kirimanjeshwara, Sarappadi Narasimha Prasad


This research provides a strategy for enhancing the precision of face sketch identification through adversarial sketch-photo transformation. The approach uses a generative adversarial network (GAN) to learn to convert sketches into photographs, which may subsequently be utilized to enhance the precision of face sketch identification. The suggested method is evaluated in comparison to state-of-the-art face sketch recognition and synthesis techniques, such as sketchy GAN, similarity-preserving GAN (SPGAN), and super-resolution GAN (SRGAN). Possible domains of use for the proposed adversarial sketch-photo transformation approach include law enforcement, where reliable face sketch recognition is essential for the identification of suspects. The suggested approach can be generalized to various contexts, such as the creation of creative photographs from drawings or the conversion of pictures between modalities. The suggested method outperforms state-of-the-art face sketch recognition and synthesis techniques, confirming the usefulness of adversarial learning in this context. Our method is highly efficient for photo-sketch synthesis, with a structural similarity index (SSIM) of 0.65 on The Chinese University of Hong Kong dataset and 0.70 on the custom-generated dataset.


Adversarial learning; Deep learning; Face sketch recognition; Generative adversarial network hyperparameter; Structural similarity index

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).