An identification of the tolerable time-interleaved analog-to-digital converter timing mismatch level in high-speed orthogonal frequency division multiplexing systems

Vo Trung Dung Huynh, Linh Mai, Hung Ngoc Do, Minh Ngoc Truong Nguyen, Trung Kien Pham

Abstract


High-speed Terahertz communication systems has recently employed orthogonal frequency division multiplexing approach as it provides high spectral efficiency and avoids inter-symbol interference caused by dispersive channels. Such high-speed systems require extremely high-sampling
time-interleaved analog-to-digital converters at the receiver. However, timing mismatch of time-interleaved analog-to-digital converters significantly causes system performance degradation. In this paper, to avoid such performance degradation induced by timing mismatch, we theoretically determine maximum tolerable mismatch levels for orthogonal frequency division multiplexing communication systems. To obtain these levels, we first propose an analytical method to derive the bit error rate formula for quadrature and pulse amplitude modulations in Rayleigh fading channels, assuming binary reflected gray code (BRGC) mapping. Further, from the derived bit error rate (BER) expressions, we reveal a threshold of timing mismatch level for which error floors produced by the mismatch will be smaller than a given BER. Simulation results demonstrate that if we preserve mismatch level smaller than 25% of this obtained threshold, the BER performance degradation is smaller than 0.5 dB as compared to the case without timing mismatch.

Keywords


bit error rate; orthogonal frequency division multiplexing; rayleigh channels; time-interleaved analog-to-digital converter; timing mismatch;

Full Text:

PDF


DOI: http://doi.org/10.11591/ijece.v12i2.pp1667-1674

Creative Commons License
This work is licensed under a Creative Commons Attribution-ShareAlike 4.0 International License.

International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).