Thakur, Sandeep, Global Institute of Engg. and Technology Markpur, India

• Vol 9, No 3: June 2019 - Circuits and Electronics
  Fault modeling and parametric fault detection in analog VLSI circuits using discretization
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES) in collaboration with Intelektual Pustaka Media Utama (IPMU).