Fook, Lee Weng, Emerald System Design Center, Malaysia

• Vol 15, No 1: February 2025 - Circuits and Electronics
  A new 13N-complexity memory built-in self-test algorithm to balance static random access memory static fault coverage and test time
  Abstract  PDF

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International Journal of Electrical and Computer Engineering (IJECE)
p-ISSN 2088-8708, e-ISSN 2722-2578

This journal is published by the Institute of Advanced Engineering and Science (IAES).